Title: 2D levelness measuring method and apparatus thereof
Application Number: 200610097596 Application Date: 2006.11.10
Publication Number: 1948903 Publication Date: 2007.04.18
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01C9/18;G01C5/00;G01C15/00
Applicant(s) Name: Suzhou Univ. Address:
Inventor(s) Name: Zhou Wang
Attorney & Agent: taohai feng
Abstract:
    The invention relates to levelness measuring method and device. It uses laser as detecting collimated light source, offset caused by different refractive index medium interface facula for light beam to realize two-dimension levelness high precision measure. It is based on classic light reflection principle, uses two-dimension PSD position-sensitive sensor as mark target to increase measuring precision. The adopted medium is high refractive index liquid and low refractive index gas which can increase light beam refraction angle to improve level sensor resolution. The output type is analog quantity or digital signal which is easy to match with meter or computer equipment. The device has the advantages of simple structure, reliable measuring data, exact calculating result which can realize two-dimension levelness quantitative detection.
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