| Title: | Acid-free cleaning process for substrates, in particular masks and mask blanks | ||
| Application Number: | 200610152856 | Application Date: | 2006.10.20 |
| Publication Number: | 1958177 | Publication Date: | 2007.05.09 |
| Approval Pub. Date: | Granted Pub. Date: | ||
| International Classifi-cation: | B08B3/00;B08B3/12;B08B3/02;B08B3/08;F26B5/08;G03F1/00;G03F7/26 | ||
| Applicant(s) Name: | Schott AG | Address: | |
| Inventor(s) Name: | Harald Koster;Dr. Henryson O. Omoregie Sr Eit | ||
| Attorney & Agent: | wangyuan fang liuguo wei | ||
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Abstract: |
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| The invention relates to a novel and advantageous method for cleaning substrate, in particular masks or mask substrate. The method provided in this invention is characterized in that providing a continuous process which includes UV processing, fulljet cleaning, mega-sonic cleaning and DI (De-ionized) water cleaning. Acid cleaning process and utilizing a special alkali detergent composition is not included in present invention. | |||
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| Time: | 11 | ||
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