Title: Method and apparatus for testing and sorting join arrangement electronic devices
Application Number: 200510038776 Application Date: 2005.04.08
Publication Number: 1669675 Publication Date: 2005.09.21
Approval Pub. Date: 2007.08.15 Granted Pub. Date: 2007.08.15
International Classifi-cation: B07C5/344
Applicant(s) Name: Nanjing Panda Instruments Co., Ltd. Address:
Inventor(s) Name: Chen Xiaozheng;Huang Yi;Zhang Yi
Attorney & Agent: zhang supei
Abstract:
    The invention relates to method for testing and sorting the gang electronic device, which comprises the following steps: a) step-by-step driving the electronic device according to the space between two devices in sequence, b) transporting to the pre-cutting station, keeping one pin on the connecting plate and cutting off the other, c) transporting to the testing station to test, driving the testing box through the adjustable apparatus, connecting the tested electric pole with the pin to get the apparatus parameter, d) cutting the scoring pin in the final-cutting station, then transporting to the baiting sorting device. The invention has high precision of gearing and high automation, uses several photoelectric sensors and overtravel-limit switches to test, which can pinpoint exactly and judge the fault precisely, and increase the sorting speed violently.
Time: 7