Title: Device and method for measuring film, coating device and method
Application Number: 200610126780 Application Date: 2006.09.01
Publication Number: 1924517 Publication Date: 2007.03.07
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01B11/06;G01B21/08;B05C11/02;H01M4/04
Applicant(s) Name: Matsushita Electric Ind Co., Ltd. Address:
Inventor(s) Name:
Attorney & Agent: huangyi wen
Abstract:
    Provided is a film measuring device capable of accurately and easily measuring the thickness of a film formed on a film-like or sheet-like base member of an object under test. A color CCD sensor 8 shoots the object under test. A video board 11 converts a color tone of a color image signal concerning the film obtained by the image pickup into gradation data of respective color components of RGB. Then, an image processing board 12 extracts line images of the respective color components. A calculator 14 obtains the thickness of the film of the object under test by referring to pre-measured film thickness reference values corresponding to the gradation data of the green or blue color component, which are stored in a table storage 13 as reference thickness table data, using the gradation data of the line image of the green or blue color component as lookup data.
Time: 19
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