Title: X-ray inspection apparatus and x-ray inspection method
Application Number: 200410088251 Application Date: 2004.08.27
Publication Number: 1595124 Publication Date: 2005.03.16
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01N23/04,H05G1/26,H05G1/08,H05G1/02
Applicant(s) Name: Matsushita Electric Ind Co., Ltd. Address:
Inventor(s) Name: Ichihara Masaru, Yoshino Shinji, Inoue Hiroyuki, K
Attorney & Agent: bao yudun
Abstract:
     The X-ray inspection device and the X-ray inspection method according to the present invention are configured to hold an object to be inspected irradiated with an X-ray from an X-ray irradiation device, uses a swinging device for performing swinging motion of tilting the object to be inspected at an arbitrary angle and in an arbitrary direction, images the X-ray that passes through the object to be inspected in an X-ray detection device and extracts data of a desired cross section from the X-ray image of the X-ray detection device in a control device.
Time: 10
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