Title: Method for an x-ray machine
Application Number: 200610110121 Application Date: 2006.08.08
Publication Number: 1912604 Publication Date: 2007.02.14
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01N23/083;G06T7/00;H05G1/00
Applicant(s) Name: Siemens AG Address:
Inventor(s) Name: Grasruck Michael;Stierstorfer Karl
Attorney & Agent: shao yali li xiaoshu
Abstract:
    The invention relates to a method for determining a characteristic parameter H in an image area (1) as a measure of a homogeneity of a substance (2; 3) in an object (4), and to a method for segmenting a substance (2; 3) in an image that uses the characteristic parameter H as an additional segmentation criterion. In the method, at least two X-ray images (5, 6) are acquired in relation to different energies E1 , E2 of an X-radiation, and the parameter H is determined from the statistical distribution of attenuation values Di(E1),Di(E2) where i=1, ..., N in the image area (1) such that faulty classifications (7) can be avoided in a simple way during the segmentation.
Time: 9