Title: Method and structure for AC coupled insitu ESD protection
Application Number: 200610057189 Application Date: 2006.03.10
Publication Number: 1870379 Publication Date: 2006.11.29
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: H02H9/00,H05F3/00,H05F3/02
Applicant(s) Name: Agilent Technologies Inc. Address:
Inventor(s) Name: Kerley John C.
Attorney & Agent: wang yi
Abstract:
     A structure and method operable to provide ESD protection for protected circuitry of automatic test equipment (ATE). In a disable mode, the first voltage potential and second voltage potential are substantially equivalent to the reference potential resulting in a clamping circuit providing a nominal clamping voltage to the protected circuit so that an ESD event having a voltage between the first voltage potential and the second voltage potential is shunted to the reference potential via first and second ESD rails, wherein the ESD event is received on a DUT node coupled to the one or more signal rails of the protected circuitry.
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