| Title: | Method and apparatus for obtaining path wear-out error | ||
| Application Number: | 200610168014 | Application Date: | 2006.12.15 |
| Publication Number: | 1976528 | Publication Date: | 2007.06.06 |
| Approval Pub. Date: | Granted Pub. Date: | ||
| International Classifi-cation: | H04Q7/34;H04B17/00;H04B7/26 | ||
| Applicant(s) Name: | Beijing Zhongxing Microelectronic Co., Ltd. | Address: | |
| Inventor(s) Name: | Guo Wei | ||
| Attorney & Agent: | songzhi qiang mahai meng | ||
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Abstract: |
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| A method for obtaining loss error of path obtains loss error of path by user device UE according to corresponding relation of obtained emission time lead TA regulation value to path loss error. The device used for obtaining loss error of path is also disclosed. | |||
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| Time: | 8 | ||
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