Title: Measuring method for polarized dependent loss PDL
Application Number: 200610125444 Application Date: 2006.12.12
Publication Number: 1988419 Publication Date: 2007.06.27
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: H04B10/08;H04B10/12
Applicant(s) Name: Guangxun Science and Technology Co., Ltd., Wuhan Address:
Inventor(s) Name: Zhang Lu;Hu Qianggao;Jiang Shan;Song Peng;Liu Yong
Attorney & Agent: zhubi wu
Abstract:
    This invention relates to a measurement method for PDL characterizing that: an incident modulated optical signal enters into a dual-refraction device to pass through a polarization rotor, a PDL device to be tested and enters into a polarization meter finally to let the rotor rotate a circle axially to note down the appeared DOP maximum value and the minimum value and compute the PDL value of related device, which is advantaged that it can measure PDL value in optical devices or system under single wavelength or multiple wave lengths and realize intelligent measurement to PDL without monitor.
Time: 10