Title: Integrated circuit tester
Application Number: 200610163190 Application Date: 2006.11.29
Publication Number: 1975450 Publication Date: 2007.06.06
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01R31/28;G01R31/00;G09G3/00;G09G3/36;G02F1/13;H03M1/12
Applicant(s) Name: Yokogawa Electric Corp. Address:
Inventor(s) Name: Naganuma Hideki
Attorney & Agent: bomai wen huangxiao lin
Abstract:
    The object of the present invention is to execute an integrated circuit tester capable of carrying out mesurement with high distinguishability and high precision without adopting the shift subtraction calculator. The present invention improves the integrated circuit tester which tests the output of the tested object by the A/D converter. The present device is characted in that it has pressure generating unit to variablely supply the upper limit of the voltage reference and the lower limit of the voltage reference to the A/D converter according to the output of the tested object.
Time: 13
<- Previous Patent:A/D converter   |  Next Patent:Parity check matrix, method for g... ->