Title: Apparatus and method of auto-regulating testing clock frequency
Application Number: 200610063569 Application Date: 2006.11.09
Publication Number: 1948983 Publication Date: 2007.04.18
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01R31/3185;G01R31/319;G01R31/317;G01R31/28;H03L7/00;G06F11/22;G06F11/267
Applicant(s) Name: Huawei Tech. Co., Ltd. Address:
Inventor(s) Name: Hua Sizhen;Li Yingwu;Xu Guangxiao
Attorney & Agent: yizhao guowei gang
Abstract:
    The invention relate to the device automatically adjusted boundary scan to test clock rate. It includes scanning unit used to scan chain circuit and adjust whether TCK frequency is reliable or not, adjusting unit used to set up initial TCK frequency and reduce the current TCK frequency when it is not reliable, the first judging unit used to judge whether the adjusted TCK frequency is less than the given frequency lower limit or not and transmit it to the scanning unit if it is not, the first output unit used to output testing failing information if it is, the second output unit used to output testing successful information when the TCK frequency is reliable. The invention can avoid manual intervention, improve application efficiency, increase chip testing automaticity, production efficiency, and reduce man power investment, manual intervention time cost.
Time: 9
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