| Title: | Thyristor phase-selecting switch experiment device | ||
| Application Number: | 200610118800 | Application Date: | 2006.11.28 |
| Publication Number: | 1971298 | Publication Date: | 2007.05.30 |
| Approval Pub. Date: | Granted Pub. Date: | ||
| International Classifi-cation: | G01R31/00;H03K17/00 | ||
| Applicant(s) Name: | Shanghai Electrical Appliances Research Institute | Address: | |
| Inventor(s) Name: | Xu Fangrong;Ruan Yudong;Ying Cheng | ||
| Attorney & Agent: | baibi hua | ||
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Abstract: |
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| The invention relates to a thyristor phase switch testing device, the comprehensive microprocessor and thyristor technique are used in the device; the projection angle of switch is operated by the drive pulse phase of the thyristor. The device includes: host CPU, acquisition circuit of input-output signal, switch power supply, input-output interface, touching screen communication, upper machine communication, CPLD signal processing circuit, thyristor trigger circuit, power return circuit and thyristor; the electrical signal transitive relation is: the thyristor trigger circuit triggers the thyristor, the signal is transmitted to the acquisition circuit, processed by the host CPU, and separately transmitted to the touching screen communication, the upper machine communication and the input-output interface, the CPLD signal processing circuit and switch power supply provide power for the host CPU, thyristor and power return circuit, and the signal is output. | |||
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| Time: | 10 | ||
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