Title: Open-loop slew-rate controlled output driver
Application Number: 200610159395 Application Date: 2006.09.28
Publication Number: 1941630 Publication Date: 2007.04.04
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: H03K19/003;H03K19/0175;H03F3/26
Applicant(s) Name: Hynix Semiconductor Inc. Address:
Inventor(s) Name:
Attorney & Agent: shaoya li lixiao shu
Abstract:
    A slew-rate controlled output driver for use in a semiconductor device includes: a process, voltage and temperature (PVT) variation detection unit having a delay line for receiving a reference clock in order to detect a delay amount variation of the delay line determined according to the PVT variation; a selection signal generation unit for generating a driving selection signal which corresponds to a detection signal generated by the PVT variation detection unit; and an output driving unit having a plurality of driver units controlled by an output data and the driving selection signal for driving an output terminal with a driving strength which corresponds to the PVT variation.
Time: 10
<- Previous Patent:Self powered gate driver system   |  Next Patent:Magnetic encoder ->