| Title: | Process for producing a free-standing III-N layer, and free-standing III-N substrate | ||
| Application Number: | 200610162841 | Application Date: | 2006.11.24 |
| Publication Number: | 1988109 | Publication Date: | 2007.06.27 |
| Approval Pub. Date: | Granted Pub. Date: | ||
| International Classifi-cation: | H01L21/20;H01L33/00;H01S5/02 | ||
| Applicant(s) Name: | Freiberger Compound Mat GmbH | Address: | |
| Inventor(s) Name: | Leibiger Gunnar;Habel Frank;Eichler Stefan | ||
| Attorney & Agent: | caisheng wei | ||
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Abstract: |
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| A process for producing a free-standing III-N layer, where III denotes at least one element from group III of the periodic system, selected from Al, Ga and In, comprises depositing on a Li(Al,Ga)Ox substrate, where x is in a range between 1 and 3 inclusive, at least one first III-N layer by means of molecular beam epitaxy. A thick second III-N layer is deposited on the first III-N layer by means of a hydride vapor phase epitaxy. During cooling of the structure produced in this way, the Li(Al,Ga)Ox substrate completely or largely flakes off the III-N layers, or residues can be removed if necessary, by using etching liquid, such as aqua regia. A free-standing III-N substrate being substantially free of uncontrolled impurities and having advantageous properties is provided. | |||
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| Time: | 29 | ||
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