Title: Thin-film semiconductor integrated circuit and mfg. method thereof
Application Number: 200310103678 Application Date: 1994.10.20
Publication Number: 1495884 Publication Date: 2004.05.12
Approval Pub. Date: 2006.07.05 Granted Pub. Date: 2006.07.05
International Classifi-cation: H01L29/786
Applicant(s) Name: Semiconductor Energy Laboratory Co., Ltd. Address:
Inventor(s) Name: Onuma Toshimitsu, Hiroki Masaaki
Attorney & Agent: chen ji
Abstract:
     In a semiconductor integrated circuit, a plurality of thin film transistors (TFTs) are formed on the same substrate having an insulating surface. Since gate electrodes formed in the TFTs are electrically insulated each other, voltages are applied independently to gate electrodes in an electrolytic solution during an anodization, to form an anodic oxide in at least both sides of each gate electrode. A thickness of the anodic oxide is changed in accordance with characteristics of the TFT. A width of high resistance regions formed in an active layer of each TFT is changed by ion doping using the anodic oxide having a desired thickness as a mask.
Time: 4
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