| Title: | High-light ion metal-doping device and its method | ||
| Application Number: | 85106757 | Application Date: | 1985.09.10 |
| Publication Number: | 1010416 | Publication Date: | 1987.04.15 |
| Approval Pub. Date: | Granted Pub. Date: | 1990.11.21 | |
| International Classifi-cation: | C23C10/00,C23C14/00,C23C14/48 | ||
| Applicant(s) Name: | Technology Inst., Ministry of Electronics Industry | Address: | |
| Inventor(s) Name: | |||
| Attorney & Agent: | QIU YINGFENG XU XIAN | ||
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Abstract: |
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| The present invention discloses a high-light ion metal-doping device and its method which has been designed by using secondary firing phenomenon. The depth of doring layer is apparently increased. The thickness of molybdenum-doped layer can reach 285 micrometre. There is no limitation on sorts of metal to be doped. On the cathode seat there is a drum-type target made of the doped metal, work piece is put inside the target with broken doring metal around the work piece. Under suitable condition ionization causes "avalanche" inside drum-type target, forming a high-light ion region, and strong light ion metal-doping process is achieved. The temp. at this region can reach 1700 deg.C. It can be used as a novel high temp. energy source for scientific research. | |||
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| Time: | 7 | ||
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