Title: Integral automatic integrating testing system
Application Number: 200610154952 Application Date: 2006.11.30
Publication Number: 1971651 Publication Date: 2007.05.30
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G08C19/00;G08C19/16
Applicant(s) Name: Zhejiang University Address:
Inventor(s) Name: Huang Keqiang;An Qingmin;Wu Mingguang
Attorney & Agent: zhangfa gao
Abstract:
    The invention discloses an integrated auto integration testing system which includes: testing signal generating unit, hard logic gate master control unit, acquisition unit for the response signal of measurand, data storage unit, data communication unit, and sensor. The testing signal generating unit contains: DSP digital processing unit, and D/A converter; testing signal generating unit is connected with the hard logic gate master control unit, the acquisition unit for the response signal of measurand, the data storage unit, and hard logic gate master control unit, the sensor is connected with the acquisition unit for the response signal of measurand and data storage unit, the hard logic gate master control unit is connected with the data communication unit. The invention has high measuring accuracy, low cost, decreasing the outer connecting lines and good convenience. The testing system has high reliability and stability.
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