Title: Logic cluster fault testing method for non-boundary scanning device
Application Number: 02118303 Application Date: 2002.04.23
Publication Number: 1453593 Publication Date: 2003.11.05
Approval Pub. Date: 2006.04.26 Granted Pub. Date: 2006.04.26
International Classifi-cation: G06F11/28,G01R31/26,H01L21/66
Applicant(s) Name: Huawei Techn Co., Ltd. Address: 518057
Inventor(s) Name: Li Yingwu, You Zhiqiang
Attorney & Agent: li qiang
Abstract:
     The logic cluster fault testing method for non-boundary scan device features that test excitation is output to the logic cluster of non-boundary scan device via the boundary scanner adjacent to the non-boundary scan device to capture test response, and the test response is further compared and analyzed to complete the logic cluster fault test of the non-boundary scan device. The test method of the present invention has low cost and simple and convenient operation, and is one efficient but cheap chip fault testing method.
Time: 5
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