Title: Continuous time measuring system based on flow line logic control and vernier time interpolation method
Application Number: 200510010006 Application Date: 2005.05.20
Publication Number: 1719352 Publication Date: 2006.01.11
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G04F10/00,G04F10/04
Applicant(s) Name: Harbin Polytechnic Univ. Address: 150001
Inventor(s) Name: Meng Shengwei, Fu Ping, Feng Lei, Li Qiong
Attorney & Agent: wang jidong
Abstract:
     The present invention relates to a continuous time-measuring system based on production-line logic control and vernier time interpolation method, belonging to the field of application of automation test instrument and system. In said invention every group of vernier time interpolation circuits is formed from coincidence circuit and vernier clock counter, the signal output end of the coincidence circuit is connected with counting control end, the output end of the vernier clock generator is connected with public clock signal end of production-line logic control and vernier clock distribution circuit, one signal output end of the above-mentioned clock distribution circuit is connected with signal input end of coincidence circuit, the output end of main clock generator is connected with clock signal input end of coincidence circuit and the data output end of the vernier clock counter is respectively connected with data input end of vemier interpolation result memory.
Time: 6
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