Title: X ray interferometer with twin zone plates
Application Number: 200410067779 Application Date: 2004.11.03
Publication Number: 1603737 Publication Date: 2005.04.06
Approval Pub. Date: Granted Pub. Date: 2006.02.22
International Classifi-cation: G01B9/021,G03H1/04,G01N23/00
Applicant(s) Name: Shanghai Institute of Optics and Fine Mechanics, C Address: 201800
Inventor(s) Name: Chen Jianwen, Gao Hongyi
Attorney & Agent: zhang zechun
Abstract:
     The invention provides a twin wave zone plate X-ray interferometer, which comprises X-ray source and is characterized by the following: it is to locate first wave zone plate and second wave zone plate with their centers slight bias and close along the direction of X-ray moving direction; it is to locate a sample rack behind the focuses of the first and second wave zone plates; then to locate a X-ray detector to detect interferometer photograph.
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