Title: Method for calibrating space resolution ratio of high-resolution digital interference instrument
Application Number: 200510027683 Application Date: 2005.07.12
Publication Number: 1710376 Publication Date: 2005.12.21
Approval Pub. Date: 2006.12.27 Granted Pub. Date: 2006.12.27
International Classifi-cation: G01B9/021,G03H1/04
Applicant(s) Name: Shanghai Optical Precision Mechanics Inst., Chines Address: 201800
Inventor(s) Name: Chen Jianwen, Gao Hongyi, Li Ruxin
Attorney & Agent: zhang zechun
Abstract:
     A method for calibrating space resolution of digital interferometer includes setting up Mach- Zehnder interferometer and using CCD detector to shoot an interference pattern with carrier wave fringe , inserting phase sample with accuracy of lambda/ 10 in arm of said interferometer and shooting an interference pattern being modulated by sample , carrying Fourier transform for two patterns in computer separately and picking up phase data of two patterns , amplifying them after subtraction , picking up local area from amplified pattern and amplifying the phase difference for it.
Time: 9
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