| Title: | Method and device using ArF photoresist | ||
| Application Number: | 97126153 | Application Date: | 1997.12.31 |
| Publication Number: | 1187495 | Publication Date: | 1998.07.15 |
| Approval Pub. Date: | Granted Pub. Date: | ||
| International Classifi-cation: | C08F18/24;C08F32/00;G03F7/00 | ||
| Applicant(s) Name: | Hyundai Electronics Industries Co., Ltd. | Address: | |
| Inventor(s) Name: | Jae-chang Jung;Cheol-kyu Bok;Ki-ho Baik | ||
| Attorney & Agent: | ding yebeng | ||
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Abstract: |
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| A photoresist includes a copolymer of one or more bicycloalkene derivatives with maleic anhydride and/or vinylene carbonate, and has a molecular weight of 3000 to 100,000. The photoresist can be used for submicrolithography employing deep ultra violety as a light source. In addition to being of high etch resistance and thermal resistance, the photoresist has good adhesiveness and can be developed in a TMAH solution. | |||
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| Time: | 5 | ||
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