| Title: | Scintillator for an X-ray detector with a variable reflector | ||
| Application Number: | 200580007005 | Application Date: | 2005.02.21 |
| Publication Number: | 1930491 | Publication Date: | 2007.03.14 |
| Approval Pub. Date: | Granted Pub. Date: | ||
| International Classifi-cation: | G01T1/20 | ||
| Applicant(s) Name: | Koninkl Philips Electronics NV | Address: | |
| Inventor(s) Name: | |||
| Attorney & Agent: | chengtian zheng chenjing jun | ||
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Abstract: |
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| The invention concerns an X-ray detector with a photo-sensitive detector layer (10) above which a scintillation layer (30) for the conversion of X-rays (X) into photons (v) is disposed. Photons (v) are reflected back into the scintillation layer (30) by a reflector (40) that is provided on the scintillation layer (30) for an improved signal gain and signal-to-noise ratio. The reflectivity of the reflector (40) can be externally controlled. This is achieved for example by a reflective layer (41, 42, 43) of E-Ink being disposed between two electrodes (44a, 44b). Thus the reflectivity can be decreased at sufficiently high X-ray doses in order to improve image sharpness and dynamic range of the detector. | |||
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| Time: | 6 | ||
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