Title: X-ray detector with correction for scattered radiation
Application Number: 200580021181 Application Date: 2005.06.24
Publication Number: 1973213 Publication Date: 2007.05.30
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01T1/164
Applicant(s) Name: Philips Intellectual Property Address:
Inventor(s) Name: Schweizer Bernd;Vogtmeier Gereon;Engel Klaus Juerg
Attorney & Agent: liya fei wangyong
Abstract:
    The invention refers to X-ray devices, an X-ray detector and a method of correcting intensity signals. An X-ray detector then comprises for determining the intensity of X-rays, which comprise a proportion of primary radiation having an irradiation direction and a proportion of scattered radiation, at least a first sensor element and second sensor elements, which are each provided for converting the X-rays into first and second intensity signals, and a filter element, which is provided for decreasing the proportion of scattered radiation in the intensity of the X-rays, wherein the second sensor elements are arranged in irradiation direction behind the filter element and wherein the first sensor element fastened to the filter element is provided for determining the intensity of the X-rays before leaving the filter element. The proportion of the scattered radiation calculated from the measuring data of the first and second sensor elements is provided for correcting the second intensity signals for the following image generation.
Time: 8