Title: Integrated circuit device tester
Application Number: 97191480 Application Date: 1997.11.13
Publication Number: 1206467 Publication Date: 1999.01.27
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01R31/319
Applicant(s) Name: Advantest Corp. Address:
Inventor(s) Name: Okayasu Toshiyuki
Attorney & Agent: ma ying
Abstract:
    In an IC device tester for testing IC devices held in contact with a test head, optical signals are employed for all signal exchanges between a tester mainframe and the test head and signal transmission lines therebetween are all formed by optical fibers, whereby the cable group interconnecting the tester mainframe and the test head can be made small in diameter and can be extended as required.
Time: 13