| Title: | Horizontal transfer test handler | ||
| Application Number: | 97120183 | Application Date: | 1997.11.18 |
| Publication Number: | 1208258 | Publication Date: | 1999.02.17 |
| Approval Pub. Date: | 2004.07.28 | Granted Pub. Date: | 2004.07.28 |
| International Classifi-cation: | B65G47/46;G01R31/01 | ||
| Applicant(s) Name: | Advantest Corp. | Address: | |
| Inventor(s) Name: | Kuniaki Bannai | ||
| Attorney & Agent: | jian wei | ||
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Abstract: |
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| A horizontal transfer test handler for transferring IC devices under test in horizontal directions to and from a test head. The test handler includes, a device tray provided on an upper surface of the test handler for carrying a plurality of IC devices to be tested in seats formed on a horizontal plane of the device tray, an IC socket mounted on the test head to interface between the IC device under test and an IC tester by establishing electrical connections therebetween, a device transfer mechanism for picking, transferring, and placing the IC device under test by moving horizontal and vertical directions on the upper surface of the test handler, a video data acquisition device for acquiring video data of an image shown on the surface of the detector, and a reference position marker provided for providing reference position data in the video data obtained by the video data acquisition device. | |||
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| Time: | 14 | ||
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