Title: IC testing device
Application Number: 97181347 Application Date: 1997.11.20
Publication Number: 1244923 Publication Date: 2000.02.16
Approval Pub. Date: Granted Pub. Date: 2004.10.13
International Classifi-cation: G01R31/26,H01L21/66
Applicant(s) Name: Advantest Corp. Address:
Inventor(s) Name:
Attorney & Agent: ma ying
Abstract:
     An IC testing device in which a current detecting resistor is connected between the power terminal of an IC to be tested on the current flow-out side and a common potential point, a short-circuit switch is connected in parallel with the current detecting resistor, a large current which flows in the operating mode of the IC is bypassed through the short-circuit switch, and the voltage generated at the current detecting resistor is measured to find the current flowing in the stop mode of the IC. When the found current value is larger than a specific value the IC is judged to be defective. A voltage comparator which monitors the voltage generated at the current detecting resistor is provided in a circuit which turns off the short-circuit switch. A control means which turns on the short-circuit switch when the voltage comparator detects that the voltage at the current detecting resistor becomes higher than the specific value, and a delay control means which gradually turns off the short-circuit switch are provided.
Time: 20