Title: IC testing method and IC testing device using the same
Application Number: 97181433 Application Date: 1997.11.20
Publication Number: 1244925 Publication Date: 2000.02.16
Approval Pub. Date: Granted Pub. Date: 2004.03.10
International Classifi-cation: G01R31/26,G01R31/28
Applicant(s) Name: Advantest Corp. Address:
Inventor(s) Name:
Attorney & Agent: ma ying
Abstract:
     An IC testing device which performs a function test and a DC test. A high-resistance resistor is connected tothe output side of a DC testing device so that a function testing device can operate normally even when the DC testing device is connected tot he function testing device. Thus a function test and a DC test are conducted in parallel by forcedly performing the DC test during the execution of the function test, and the switching time of a switch is not added to the testing time by executing time-consuming controls on the DC testing device such as the switching of the switch of the switch during the function test, thereby shortening the testing time.
Time: 12
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