Title: Insulated device diagnosing system and partial discharge detecting method
Application Number: 97125433 Application Date: 1997.12.08
Publication Number: 1184940 Publication Date: 1998.06.17
Approval Pub. Date: 2004.05.19 Granted Pub. Date: 2004.05.19
International Classifi-cation: G01R31/12
Applicant(s) Name: Hitachi, Ltd. Address:
Inventor(s) Name: Toshiaki Rokunohe;Fumihiro Endo;Tokio Yamagiwa
Attorney & Agent: wang maohua
Abstract:
    An insulated device diagnosing system is capable of judging the deterioration, lifetime, and defects of a device. The intensity at each voltage phase angle is measured at a plurality of specific frequencies, taking high voltage phase angles as the abscissas. The deterioration, lifetime, and the kind and extent of abnormality of the device are judged from the pattern and intensity of the spectral distribution, which is obtained by peak-holding the measured intensity for a defined time period. According to the present invention, partial discharge can be measured highly sensitively and precisely to diagnose the deterioration, lifetime and the extent of defect of the device.
Time: 17