Title: Telescope tester structure with I-cached SIMD technology
Application Number: 97181448 Application Date: 1997.12.12
Publication Number: 1251655 Publication Date: 2000.04.26
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01R31/28;G06F11/00
Applicant(s) Name: Simd Solutions, Inc. Address:
Inventor(s) Name: Todd E. Rockoff
Attorney & Agent: ma gao
Abstract:
    A high-speed semiconductor tester system with Single Instruction-stream Multiple Data-Stream (SIMD) organization, incorporating an event generator array, a plurality of pin channels for connecting to a device under test (DUT), a reconfigurable allocator switch for assignement of event generators to individual DUT pin channel connections, multi-clocking, and SIMD instruction cache. The result is a tester digital system exhibiting a maximum ratio of performance to hardware cost.
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