Title: System and method for automatically creating and transmitting test conditions of integrated circuit devices
Application Number: 97125811 Application Date: 1997.12.23
Publication Number: 1204057 Publication Date: 1999.01.06
Approval Pub. Date: 2004.10.27 Granted Pub. Date: 2004.10.27
International Classifi-cation: G01R31/26;H01L21/66
Applicant(s) Name: Samsung Electronics Co., Ltd. Address:
Inventor(s) Name: Woo-Chul Jun;Jong-Hwan Lim;Hyun-Suk Park
Attorney & Agent: xie lina
Abstract:
    The present invention provides a system for automatically creating and transmitting test condition to a tester. The system of this invention comprises data collecting means for collecting data necessary for the test condition form a remote host which has a database storing information for production of the IC devices, operating means for creating the test condition by comparing the collected data with a predetermined handling condition, and transmitting means for transmitting the test condition to a tester host which controls a plurality of testers by making use of corresponding test programs, and for loading the test condition into a corresponding test program.
Time: 16
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