Title: Method for performing test mode of electric device
Application Number: 98104036 Application Date: 1998.01.24
Publication Number: 1189621 Publication Date: 1998.08.05
Approval Pub. Date: 2002.05.01 Granted Pub. Date: 2002.05.01
International Classifi-cation: G01R31/01
Applicant(s) Name: Samsung Electronics Co., Ltd. Address:
Inventor(s) Name: In-Soo Kim
Attorney & Agent: ma ying
Abstract:
    A method for performing a test and controlling the test mode of an electric device. The method reduces the amount of time and labor expended during fabrication, and accordingly enhances productivity by detecting time information from a timer (a clock generator, or a variable clock generator) and multiplying the detected time information by a predetermined value, and controlling the driving time of the device during a test operation in response to the multiplied time value.
Time: 26