Title: Semiconductor test system
Application Number: 98100425 Application Date: 1998.02.17
Publication Number: 1195776 Publication Date: 1998.10.14
Approval Pub. Date: 2003.05.28 Granted Pub. Date: 2003.05.28
International Classifi-cation: G01R31/26;G06F9/455
Applicant(s) Name: Advantest Corp. Address:
Inventor(s) Name: Robert F. Sauer;Kiyoshi Fukushima;Hiroaki Yamoto
Attorney & Agent: jian wei
Abstract:
    A semiconductor device test system tests a semiconductor device by applying a test signal to the device, and comparing the resultant output with expected value data.. The emulator software includes an emulator unit which emulates a function of each hardware unit of the test system, a device emulator which emulates a function of a semiconductor device to be tested, a data collecting part for acquiring data from the emulator unit necessary for carrying out a test program, and a device test emulator which generates a test signal to be applied to the device emulator based on the acquired data and compares the resultant signal from the device emulator with the expected data and stores the comparison result therein.
Time: 23
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