| Title: | Display device and testing method for display device | ||
| Application Number: | 200610149516 | Application Date: | 2006.10.12 |
| Publication Number: | 1949326 | Publication Date: | 2007.04.18 |
| Approval Pub. Date: | Granted Pub. Date: | ||
| International Classifi-cation: | G09G3/00;G01R31/02;G01R31/00;G01M11/00;G02F1/13 | ||
| Applicant(s) Name: | Samsung Electronics Co., Ltd. | Address: | |
| Inventor(s) Name: | Park Tae Hyeong;Kim Cheol Min;Kim Il Gon;Kim Chul | ||
| Attorney & Agent: | wangzhi sen huangxiao lin | ||
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Abstract: |
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| The present invention relates to a display device and a method of testing a display device. A display device according to an exemplary embodiment of the present invention includes: a gate driver for generating gate signals and applying the gate signals to switching elements; a precharge circuit for applying a predetermined voltage to the pixels to precharge the pixels; and a pad portion including a plurality of inspection pads for applying test signals to the gate driver and the precharge circuit. Accordingly, test signals are applied through pads using the gate driver and the precharge circuit, which makes it possible to check whether the two driving circuits normally operate and to detect defects, such as the disconnection or short-circuit of the signal lines, before a module process. Thus, it is possible to reduce manufacturing time and cost. | |||
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| Time: | 8 | ||
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