Title: Imaging systems, imaging device analysis systems, imaging device analysis methods, and light beam emission methods
Application Number: 200610142874 Application Date: 2006.10.27
Publication Number: 1955830 Publication Date: 2007.05.02
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G03B11/04;H04N5/225;H04N5/217;G03B43/00;G01M11/02;G01M19/00
Applicant(s) Name: Hewlett Packard Development Co. Address:
Inventor(s) Name: Gupta Anurag;Long Michael;Dicarlo Jeffrey M.
Attorney & Agent: wangxiao heng chenjing jun
Abstract:
    Imaging systems, imaging device analysis systems, imaging device analysis methods, and light beam emission methods are described. According to one aspect, an imaging device analysis method includes receiving initial light comprising a plurality of wavelengths of light, filtering some of the wavelengths of the initial light forming a plurality of light beams comprising different wavelengths of light, after the filtering, optically communicating the light beams of the different wavelengths of light to an imaging device, receiving the light beams using the imaging device, and analyzing the imaging device using light after the receiving.
Time: 6