Title: Interferometer of space heterodyne spectrograph tester
Application Number: 200610085990 Application Date: 2006.06.13
Publication Number: 1869658 Publication Date: 2006.11.29
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01N21/45,G01J3/26
Applicant(s) Name: Anhui Inst. of Optics Address: 230031
Inventor(s) Name: Ye Song, Hong Jin, Wang Yuanjun, Qiao Yanli, Fang
Attorney & Agent: yu chengdun
Abstract:
     The invention discloses a spatial heterodyne spectrometer tester interferometer, improved on the basis of Michelson interferometer, replacing two planar reflectors in the Michelson interferometer with two diffraction gratings; target light source is modulated through collimating light path system into parallel light source, and the interferometer makes spatial interference modulation on light wave to form interference stripes with a certain spatial frequency which is a function of wavelength, and the interference stripes are imaged through imaging object lens in linear array (or planar array) detector and the image is recorded by the detector and stored in computer, which can recover spectrum curve by specific algorithm.
Time: 7
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