Title: Diffraction spectrum detecting system
Application Number: 200610102110 Application Date: 2006.10.27
Publication Number: 1945241 Publication Date: 2007.04.11
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01J3/18;G01J3/28
Applicant(s) Name: Li Jie Address:
Inventor(s) Name: Li Jie
Attorney & Agent: pangjian yang
Abstract:
    The diffraction spectrum measuring system belongs to the fields of optical measurement, optical instrument, teaching apparatus and other technology. It consists of one movable foldable horizontal stand and two pedestals with the same horizontal base plane; and features the two pedestals set to form one obtuse angle, the double sided reflecting plane mirror with half-reflecting films coated to its two planes, and the reflecting grating comprising one grating stripe plane and one semi-reflecting plane. The diffraction spectrum measuring system is used in spectrometer for diffraction spectrum measurement to replace the plane mirror for optical path regulation and the grating for spectrum measurement, and has the simplified diffraction spectrum measuring process and raised measurement precision.
Time: 8
<- Previous Patent:Laser power dialgage   |  Next Patent:Method for synchronously displayi... ->