Title: Low-frequency wave rate measuring system and method
Application Number: 200510037344 Application Date: 2005.09.16
Publication Number: 1932456 Publication Date: 2007.03.21
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01H17/00
Applicant(s) Name: Hongfujin Precision Industry (Shenzhen) Co., Ltd. Address:
Inventor(s) Name:
Attorney & Agent:
Abstract:
    The invention provides the frequency measuring system of a low-frequency wave including the wave generator to emit a first wave of the fixed-frequency; a detected device to emit a second wave of the fixed-frequency which is the low-frequency wave to intervene with the first wave to generate the third wave; a sensor to collect the third wave; a computer connected with the sensor treats with the third wave to measure the frequency of the second frequency. So it can decrease the measuring cost and process complication.
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