Title: Aid device for setting inspection standard
Application Number: 200610154249 Application Date: 2006.09.18
Publication Number: 1940510 Publication Date: 2007.04.04
Approval Pub. Date: Granted Pub. Date:
International Classifi-cation: G01H17/00;G01D21/00;G01M19/00
Applicant(s) Name: Omron Tateisi Electronics Co. Address:
Inventor(s) Name:
Attorney & Agent: shaoya li lixiao shu
Abstract:
    The invention provides an aid device for setting inspection standard, including: a frame profile operation means for performing frame division of waveform data, calculating a frame profile with matrix-form data structure of characteristic quantity recorded by characteristic quantity axis and frequency axis for each frame; a profile operation means for acquiring a plurality of frame profiles on the same waveform data determined by the frame profile operation means, and determining a profile on the waveform data with matrix-form data structure of characteristic quantity recorded by characteristic quantity axis and frequency axis from the plurality of frame profiles; a storage means for storing the profile determined by the profile operation means; and a simultaneous operation means for processing value of characteristic quantity at a designated position of the profiles on a plurality of wave-form data stored in the storage means.
Time: 5