On-line detection method for function of operational amplifier
The invented method includes the following steps: making two input ends of optional amplifier ungrounded or short-circuit with power supply; making inverted input end of operational ampl...
2
98106070
Short circuit detector The device comprises: a current generator (10) for generating a current (IIN) of predetermined intensity, selectively into or out of the terminal (IN), a first voltage comparator (20) con...
Magnetic sensor A magnetic sensor with a signal processing circuit which is constituted of a magnetic sensor section (4) formed from a compound semiconductor thin film or magnetic thin film, and a signal...
Auto-lock type continuity check unit A connector receiving member and a test area are provided in a relatively shiftable manner from an engaged state in which a test area engages in a continuity testable manner to a separate...
Semiconductor test system A semiconductor device test system tests a semiconductor device by applying a test signal to the device, and comparing the resultant output with expected value data.. The emulator softwar...
9
98103882
Circuit and test method A circuit (100) comprises a built-in test circuit (150) which verifies the proper operation of input cells (130) when they receive signals at a first level (71) and at a second level (72)...
10
98100535
Ferromagnetic-article sensor The present invention relates to a ferromagnetic-article sensor comprises a pathway-forming means for defining a pathway for a ferromagnetic-article; a magnet disposed adjacent to the pat...
Semiconductor device having contact check circuit A contact check circuit of a semiconductor device includes N-channel MOS transistors connected in series between pads located at opposing ends, with their gates respectively connected to ...
Infrared screening and inspection system In general, the spatial resolution and repeatability of results using infrared detectors for examining printed circuit cards has been so poor that the devices have failed to achieve comme...
Method for performing test mode of electric device A method for performing a test and controlling the test mode of an electric device. The method reduces the amount of time and labor expended during fabrication, and accordingly enhances p...
Socket for tester of semiconductor chip property
The present invention relates to a semiconductor chip performance tester socket. It is characterized by that said tester socket is assembled by using elastic contacts, circuit-connected ...
28
98800070
Method of mfg. liquid crystal display module Method of manufacturing the quality of contacts, e.g. in an LCD module in which an IC is so placed on the surface of a substrate that the external connections of the IC electrically conta...
Multimeter with both pointer and digit display
The multimeter has a pointer type indicator and a digital display in the reading screen. In the circuit part, there is input switch network and converter, ADC and digital display as well...
Contact probe unit In a conductive contact unit, the base-side end section of a compression spring which urges a contact itself or a needle-like contact is housed in a supporting hole bored into a substrate...
37
97182073
MRI magnetic field generator
An MRI magnetic field generator which does not give a subject an imaged space stably, and produces a clear image with a high sensitivity while its size is small and its cost is low. A ma...
38
97182074
MRI magnetic field generator
An MRI magnetic field generator comprising a pair of pole pieces and an inclined magnetic field coil which is attached to the pair of the pole pieces. The adjustment of the magnetic fiel...
39
97129715
IC testing method and apparatus Two contact heads are used to convey IC devices between an IC device testing part E and a contact arm operating stage ST3 and a buffer stage ST4 is interposed between the contact arm oper...
40
97182134
Leakage current correction circuit
A leakage current correction circuit for reducing a leakage current flowing to an output of a circuit in a high-impedance state,comprising a correction unit which includes a current dete...
Memory test set The present invention relates to a memory testing apparatus capable of testing both memories of a parallel input/parallel output type and a serial input/serial output type, in case of tes...
Measuring equipment for electricity meter The measurement device(1) which connects to electricity meter circuit has a shunt with first and second connection terminals (6,7) arranged on a shunt board for supply of a voltage equal ...
47
97181448
Telescope tester structure with I-cached SIMD technology A high-speed semiconductor tester system with Single Instruction-stream Multiple Data-Stream (SIMD) organization, incorporating an event generator array, a plurality of pin channels for c...
Standard industrial frequency three phase source
A three-phase main-frequency standard source uses single-chip computer as its control center, digitally synthetic sine wave as three-phase standard signal source, and the six signals who...
58
97182291
Antenna adapter An antenna adapter (100) for interfacing a portable radiotelephone (200) with external equipment. In a preferred embodiment, a connector assembly (404) includes a first connector portion ...
59
97181433
IC testing method and IC testing device using the same
An IC testing device which performs a function test and a DC test. A high-resistance resistor is connected tothe output side of a DC testing device so that a function testing device can ...
60
97181347
IC testing device
An IC testing device in which a current detecting resistor is connected between the power terminal of an IC to be tested on the current flow-out side and a common potential point, a shor...
Horizontal transfer test handler A horizontal transfer test handler for transferring IC devices under test in horizontal directions to and from a test head. The test handler includes, a device tray provided on an upper s...
63
97126417
Semiconductor device testing apparatus The tester has a test-head (13) which consists of a screening housing (100) fixed to the function plate (30) of the main test-head unit (13). This covers an IC socket (20) in the centre o...
64
97191480
Integrated circuit device tester In an IC device tester for testing IC devices held in contact with a test head, optical signals are employed for all signal exchanges between a tester mainframe and the test head and sign...
65
97181356
Apparatus for measuring impedance of a resonant structure Apparatus for measuring the value of a physical quantity which affects the impedance of an electrically resonant structure, said apparatus comprising an electrically resonant structure, a...
66
97120280
Expert diagnostic method for fault of dc. motor
The present invention discloses an expert diagnosis method for direct-current dynamo failure, and said method is implemented by means of two portions of data collecting system and failur...
Failure diagnosis device A failure diagnostic apparatus for electronic device is disclosed. When one of the failure detecting devices disposed at some spots in an electronic appliance detects failure of the elect...
69
97107752
Method for leading from interior of coils of electric appliance
A method for leading wire out of electric appliances is disclosed. It features that the tapping points of lead-out wires are the intermediate points of working windings or the common poi...
70
97192066
Modular core, self-powered powerline sensor A modular core, self-powered powerline sensor (10) includes a plurality of modular core elements (18, 20, 22) for disposing about an a.c. powerline (12); a winding layer to be energized b...
71
97119959
Automatic metallurgical facilites testing machine
An automatic tester for metallurgical facilities is disclosed. The I/O port, output buffer and decoder are sequentially connected between computer control interface and metallurgical fac...
Concentrated intelligent watt-hour meter
The concentrated intelligent watt-hour meter includes triphase house lead-in unit, voltage and current sampling unit, separate measuring unit, user connection unit, display unit, data pr...
Coiled tubing inspection system A non-destructive inspection system is disclosed for testing oilfield tubulars and particularly for testing coiled tubing. The system includes a support housing and an inspection head (30...
77
97116984
Magnetic microstrip line and its application
The present invention relates to a magnetic film device, especially an operating on magnetic impedance effect and its applictation. The present invention consists of magnetic film micros...
78
97191357
Opening arrangement of ammeter pincers The invention concerns an opening arrangement of pliers such as a clamp-on probe. The arrangement comprises a fixed pliers jaw (1) carried by a fixed lever (2) and a mobile pliers jaw (3)...
79
97198612
Modular, semiconductor reliability test system A system (10) for performing semiconductor reliability tests is disclosed including an oven (36) having open axial ends for slideably receiving a board (12). The board (12) includes an ov...
80
97121309
Electrode handle for determining man body resistance
An electrode handle for measuring human body's impedence in simple and comfortable mode has an enlarged part in the axial center of the insulating handle. Two held parts whose width is s...
Active control of acoustic output in gradient coils An acoustically controlled magnetic coil system is provided in which suitable non-magnetic transducers are embedded in a block of acoustic material in which the coil is also embedded, the...
84
97119240
Checking system A test system, A relay 20, which is connected to handlers 30A, 30B and a tester 40, collects some information on the working condition of these devices, counts the number of objects, and ...
85
97116916
Method for detecting residual capacitance of storage battery
The method for measuring residual charge capacity of cell is characterized by that it makes the cell discharge for a small period of time, and at the same time measures the end voltage v...
Memory testing apparatus There is provided a memory testing apparatus which can read out the information of failure memory cells of a tested memory from a failure analysis memory having the same memory capacity a...
Impulse valtage generator circuit This invention concerns an impulse voltage generator circuit for providing a lightning voltage impulse to test the capacitance of a test piece which has two chargeable stages (1, 2). Each...
90
01121081
Digital current differential system A method of detecting faults on a power transmission line system includes simultaneously measuring phase current samples at each phase of each transmission terminal; calculating real and ...
91
97191239
Digital current differential system A method of detecting faults on a power transmission line system includes simultaneously measuring phase current samples at each phase of each transmission terminal; calculating real and ...
Volume spectroscopy having image artifact reduction Susceptibility artifacts in slice selective volume magnetic resonance spectroscopy are reduced by applying phase encoding at a nominal resolution equal to or larger than the slice selecti...
Method and device for checking electric power mutual inductor
The present invention relates to a method for checking power mutual-inductor and its checking device. It is characterized by directly measuring electric current and voltage values of pri...